Northwestern University

Characterization Instruments

JEOL JIB-4700F equipment photo

JEOL JIB-4700F

3D Optical Profiler – Zygo nexview equipment photo

3D Optical Profiler – Zygo nexview

Atomic Force Microscope – Bruker Edge equipment photo

Atomic Force Microscope – Bruker Edge

Contact Angle Measurement – VCA Optima XE equipment photo

Contact Angle Measurement – VCA Optima XE

Electrical Test Station equipment photo

Electrical Test Station

Nikon LV150 equipment photo

Nikon LV150

Reflectometer – Filmetrics F20 Equipment photo

Reflectometer – Filmetrics F20

Spectroscopic Ellipsometer – J.A. Woollam alpha-SE Equipment photo

Spectroscopic Ellipsometer – J.A. Woollam alpha-SE

Stylus Profilometer – Veeco Dektak-8 equipment photo

Stylus Profilometer – Veeco Dektak-8

Thin Film Stress Measurement System – FLX 2320-S equipment photo

Thin Film Stress Measurement System – FLX 2320-S

Optical Tensiometer, Biolin Attension Theta Flow equipment photo

Optical Tensiometer, Biolin Attension Theta Flow

F20 Thin-Film Analyzer (Cook) equipment photo

F20 Thin-Film Analyzer (Cook)

Hall Effect / Resistivity / I-V Measurements System – HMS 8404 (Cook) equipment photo

Hall Effect / Resistivity / I-V Measurements System – HMS 8404 (Cook)