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F20 Thin-Film Analyzer

Instrument Details

Features

  • Measurement of Thickness and optical constants: n and k
  • Wavelength range: 400-1000 nm
  • Thickness only: 250 Å to 50 µm
  • Thickness with n&k: 1000 Å to 5 µm

F20 Thin-Film Analyzer instrument photo

NUcore RESERVATION

Facility Contact

Main Contact: Anil Dhote, PhD
Office: Cook Hall, #4087
847-491-5959 / email

Alternate Contact: Diego Santiago De La Vega
(847) 467-2015 / email

Location

Cook Hall 4026